Showing results: 871 - 885 of 4427 items found.
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Transmission Line Pulse Test System -
Impulse Semiconductor Inc.
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Anchor Test System -
James Instruments Inc.
Two models, each with two different gauge capabilities enable precision readings over a wide range of applications - from light to heavy duty loads. The standard system has a pull stroke of two inches with an option to extend to four inches. The longer pull stroke allows for complete extraction of most fixings in one simple operation. A load diffusion bridge and pyramid are available to keep reaction loads away from the anchor point.
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Ohmcorr Test System™ -
James Instruments Inc.
OhmCorr has two probes spaced 1.97" (5cm) apart which are placed in holes drilled to a depth of 3/8th" (8mm) and filled with conductive gel. The direct digital read-out of resistivity is displayed on the LCD when the control switch is activated. OhmCorr and CorMap, when used together, provide an economical and sound diagnostic system of corrosion in reinforced concrete.
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Multi Disk Test System (4-Port) -
YEC Co. LTD
16 types of inspection modes can be registered and edited. More accurate acceptance inspections can be performed using various types of inspections.High speed data communications using USB interface for communicating with host computer.Acceleration testing for temperature loaded HDD can also be performed. (Optional)Easy attaching and removing HDD using optional plug-in unit.
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Instron
Instron offers a variety of testing systems and rigs for static, quasi-static and dynamic loading of structures and components. This includes Component Test Systems, Shaking Tables, Road Simulators, Axle Test Systems, Full Vehicle Test Systems, Wheel Test Systems, Shock Absorber Test Systems, Elastomer Test System and Dynamic Torsion Test Systems.
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Labtone Test Equipment Co., LTD
Environmental test system, Electro-dynamic Shaker, Shock Test Systems, Drop Tester, Bump Test Systems, Combined Environmental Test Systems
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ZERA GmbH
Combined with a power source system e.g. MTS140 this test bench is used as a single-phase meter test system with 40 test positions.Combined with a power source system e.g. MTS310 this test bench is used as a three-phase meter test system with 10 test positions.
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ZERA GmbH
Combined with a power source system MTS310 this test bench is used as a three-phase meter test system with the digital measuring system STM4000/6000Combined with a power source system MTS301 this test bench is used as a three-phase meter test system.
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Torontech Group
Torontech is now offering Vibration Test Systems, Shock Test Systems, Bump Test Systems, Drop Tester, and Packaging Transportation Simulators.
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Yangzhou Power Electric Co., Ltd
High current test systems are used to test the thermal stability of equipment and components. The test system induces a current in the test object causing it to heat up.The system can perform the heat cycle testing for power cables type test and pre-qualification test according to IEC 60840, and IEC 62067 etc. Based on pre-qualification test needs, test system is divided into two parts: test sample loop and simulation temperature loop.
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Shanghai Jiuzhi Electric Co., Ltd.
SGV Series DC test systems are used to test components and complete systems found in electrical power supply system what operate on DC voltage. Samgor DC voltage test systems can be implemented for tests with highest voltages according to IEC 60060-1.
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ThermalAir TA-1000B Rack Mount Test System -
MPI Thermal Test Systems
The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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ZERA GmbH
Combined with a power source system e.g. MTS750 this test bench is used as a DC meter test system with 40 test positions.
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ZERA GmbH
Combined with a power source system e.g. MTS750 this test bench is used as a DC meter test system with 40 test positions.
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AMETEK VTI Instruments
The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.